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Berlin: Dienstag, den 19. Januar 2010 - 21:05:47 Uhr
Corporation, - Accel-RF Corporation Announces Shipment of Reliability Test Systems for GaN technology to Customers in Europe 19.01.10 | 20:18 Uhr
Accel-RF Corporation, the world leader in turn-key RF Reliability Testing Systems for Compound Semiconductor devices, today announced the successful shipment and installation of five advanced high power reliability test systems to customers in Europe, in Q4 of 2009.
Shipped to both government research and commercial entities, these systems will be instrumental in the development of Gallium Nitride devices in Europe.
?Now that we have successfully shipped and installed these leading edge systems, I am pleased to announce the acceptance of our High Power Reliability Test Systems by the compound semiconductor community to test the reliability of GaN technology in the European Union,? says Roland Shaw, President and Founder of Accel-RF. ?It is exciting for us at Accel-RF to be part of the advancement and evolution of Gallium Nitride Technology and its long term reliability,? adds Shaw.
Service and first line support of these systems will be performed by Peritest Eurl, based near Paris, France. ?As a manufacturer of advanced test equipment, Accel-RF?s technical staff will always be working with our customers,? Shaw continues, ?Peritest Eurl for sales, service, and first line support in Europe has worked well for Accel-RF, and their technical expertise is excellent.?
Accel-RF has been selling RF Reliability Systems in the US since 2004. Five systems delivered and installed in Europe in Q4 of 2009 further demonstrates our successful expansion outside of the US. ?Global expansion for complex equipment like ours has to be done carefully,? adds Shaw, ?I am proud to say that even with this major expansion effort we have maintained a very close relationship with all of our customers.?
About Accel-RF
Accel-RF Corporation is a closely-held private corporation located in San Diego, California. The company specializes in the development, design, and production of accelerated life-test/burn-in test systems for RF semiconductor devices. These systems are turn-key integrated instruments that provide a cost-effective and high-value proposition for manufacturers, fabless designers, testing-service providers, original equipment manufacturers, system integrators, and research and development laboratories requiring intrinsic reliability identification, process-control validation, specification standard-deviation characterization, and product qualification testing.
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